This 8-part internet seminar series covers material that generally is not presented in XRF presentations or training courses. This is an applications course: how can a FP-XRF be used so that its data are highly dependable and defensible. Sampling design and sample handling options for FP-XRF will be covered, along with the benefits and limitations of each. Analytical and QC concerns common to using XRF are also discussed. This course will be of interest to staff developing XRF sampling and analysis plans, reviewing the plans for quality assurance, field operators, and users of XRF data for making project decisions. Concepts and practice will be illustrated using experiences from actual field projects. The capabilities of newer FP-XRF instruments will be described. Participants may register for any session of interest, but are highly encouraged to attend all 8 sessions for the full benefit of the course.
Session 2 will explain what is meant by representativeness, how to judge whether samples are representative, and how to increase representativeness.
For general information contact Jean Balent
by telephone at 202-566-0832
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Archives of past CLU-IN internet seminars are available in the CLU-IN Studio at http://clu-in.org/studio/. You will be able to view the slide and hear an audio stream of the presentation as it occurred.
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